UHV cluster tool to synthesize precise nanometer multilayer systems by MSD and PLD procedures
UHV hybrid system consisting of
- coating chamber for pulsed laser deposition processes (PLD)
- chamber for magnetron sputter deposition (MSD)
- central handling system
- sample load lock
- sample magazine
Technical data
General information
- vacuum: p < 2·10-8 mbar
- substrate: Ø = 150 mm, m = 5 kg
- targets: 4 in each chamber
- run-to-run reproducibility of the layer thickness: 99.8 %
PLD
- ablation laser: q-switched Nd:YAG with the wavelength λ = 1064 nm, 532 nm, 355 nm and pulse length τ = 4 ... 10 ns
MSD
- sputtering modi: DC and RF
- typical working pressure: pA r ≥ 7 ·10-4 mbar
- target-substrate distance: 50 ... 100 mm
Typical layer characteristics
- layer thickness: 0,2 ... 500 nm
- very low roughness in the range of 0.15 ... 0.3 nm
- uniformity: 99.5 - 99.9 % more than 150 mm
Some results
- MSD: Mo/Si multilayers with X-ray reflections of 70 % (wavelength λ = 13.5 nm, incidence angle α = 1,5 °)
- PLD: Ni/C multilayers with dP = 3.25 nm and RCu-Kα = 73 %