X-ray diffractometer D8 Discover and D5005
![X-ray diffractometer D8 Advance X-ray diffractometer D8 Advance](/en/technologyfields/pvd_nanotechnology/xray_euv_optics/equipment/X-ray_diffractometer/jcr:content/contentPar/sectioncomponent/sectionParsys/textblockwithpics/imageComponent1/image.img.jpg/1676288910480/roentgendiffraktometer.jpg)
X-ray diffractometer D8 Advance
![Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector](/en/technologyfields/pvd_nanotechnology/xray_euv_optics/equipment/X-ray_diffractometer/jcr:content/contentPar/sectioncomponent/sectionParsys/textblockwithpics/imageComponent2/image.img.gif/1676288910480/tgm-prinzip-340x200.gif)
Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector
Producer
- D8 Discover - Bruker AXS GmbH
- D5005 - Siemens
Technical data
- X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm2 long-fine focus or 0.4 x 0.4 mm2 point focus
- sample holder: fixed, Ø = 150 mm
- scintillation detector
- beam divergence: Δθ < 0.02 °
- use of Ni/C - Goebel mirror for:
- monochromization and suppression of fluorescence radiation
- suppression of Cu-Kß radiation
- simple adjustment and short measuring times for parallel beam geometry
Application
- X-ray reflectometry at thin layer systems to determine thickness, roughness and density
- X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
- development of new optical systems