Fraunhofer Institute for Material and Beam Technology IWSX-ray diffractometer D8 Discover and D5005
X-ray diffractometer D8 Advance
Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector
Producer
- D8 Discover - Bruker AXS GmbH
- D5005 - Siemens
Technical data
- X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm2 long-fine focus or 0.4 x 0.4 mm2 point focus
- sample holder: fixed, Ø = 150 mm
- scintillation detector
- beam divergence: Δθ < 0.02 °
- use of Ni/C - Goebel mirror for:
- monochromization and suppression of fluorescence radiation
- suppression of Cu-Kß radiation
- simple adjustment and short measuring times for parallel beam geometry
Application
- X-ray reflectometry at thin layer systems to determine thickness, roughness and density
- X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
- development of new optical systems