imanto® - imaging tools

The working width of a hyperspectral imaging system mainly depends on the focal length of the used lens and the working distance (WD). Thus the field of view (FOV) of a few millimeters (microscope optics) up to several meters and more can be realized.

In HSI measurements the spectral and spatial resolutions are primarily influenced by the detector’s pixel number. The spatial resolution is further determined by working width, scanning speed of the HSI system and sample velocity. This means, that hyperspectral data may have two different spatial coordinates in dependence of the acquisition parameters.

A crucial point in hyperspectral image acquisition is the choice of an appropriate lighting. The lighting is decisive for a successful measurement. A spatial homogeneous brightness helps to achieve a reliable data set and to reduce efforts in data evaluation.

In accordance with the samples morphology and structure, a spot-, line- or diffuse lighting is applied for the measurements. Special cases are transmission or specular reflection setups, which are commonly used with a microscope optic.
 

Hyperspectral imaging

• non-destructive, contact-free spatially resolved spectral measurements
• more than 100 spectral bands
• frame rates up to 1000 fps
• different wavelength and information ranges: UV, VIS, NIR
• various applications due to manifold combination/integration possibilities
• additional information in combination of image interpretation and spectral evaluation

Tabletop system

Our tabletop systems are easy to use and ready for future enhancements of the measurement platform. By default, a x-stage is adapted to the system. In addition, the appropriate imanto® lighting option and the imanto® pro software package offer a complete hyperspectral imaging solution for the first steps in hyperspectral imaging spectroscopy.
 

Large-scale and process-line setups

Large-scale and process-line setups are customized according to your needs. However the modular system of the imanto® platform fulfills the requirements of an easily configurable system setup. All boundary conditions must be considered for the integration of a reliable measurement system. We provide assistance for all steps in process line integration:

• task analysis & feasibility studies
  
• HSI system and software adaption
  
• data evaluation and development of data analysis models
  
• process line integration (i. e. Beckhoff systems)

HSI monitoring systems can be integrated into existing as well as into upcoming process lines.
 

imanto^® obsidian

• configurable with imanto^® lighting and imanto^® pro components
• tabletop system
• durable construction components
• flexible sample stages, up to 30 cm travel range
• motorized z-axis (height)
• large-scale and process line setup
• 3-axis motorization, camera movement
• dedicated control cabinets
• process line integration (i.e. to conveyor belt)
• accessory
• customized measuring tables (vacuum option) and HSI system take-up

imanto^® microscopy

• NIR and UV/VIS imaging in one system
• spatial resolving capacity: < 200 nm UV/VIS; < 2 μm NIR
• specular reflectance and transmission measurements
• motorized 3-axis workbench
• fourfold nosepiece
• use of standard microscope lenses
• optional: integration of filters and polarizers

Flexible lighting solution

Beside common line lights and spot lights, which are also available for imanto® obsidian setups, many tasks require a homogeneous lighting. The imanto® lighting solutions provide a diffuse lighting like a standard integration sphere with optical access for the HSI-system. A flexible setup allows the adaption to almost every working width. High quality components enable a long-term operation.

All lighting solutions are ready-to-use and will be combined with specially designed and stabilized power sources. For the latter, also power sources with constant output for process tasks are available as well as adjustable power sources for research tasks.

Depending on the size, the spheres are either fully made of optical PTFE or internally coated with optical PTFE. A high reflection of ≥ 98 % for the whole UV/VIS and near infrared spectral range enables the imanto® lighting device to easily perform reliable measurements. The designed working width of up to 80 cm shows a homogeneity of illumination of > 95 percent.
 

Measure reflecting substrates

Hyperspectral measurements of high specular reflecting materials such as metal substrates and others require a very homogeneous lighting for a high data quality for evaluation. Otherwise the reflection intensity superimposes the spectral information from the UV/VIS- and NIR-range by overexposure of the detector.
 

imanto® lighting

• spectral range 250 – 2500 nm
• material optical PTFE ≥ 98 % reflection
• homogeneity > 95 %
• working width up to 80 cm
• exit slit width 1 – 5 cm / adjustable
• unit power 40 – 300 W
• # sources 2 - 6 per unit

Graphical user interface

• simple, intuitive interface
  
• receipt concept
• multi-data screen
• interactive data evaluation
  
  

Interoperability

• any multi- and hyperspectral camera can be integrated
• data format: ENVI, generic HSI.JPG
• spectra and picture export
   

Data pretreatment

• offset correction (dark image)
• background correction (bright image)
• fault pixel correction
   

Supported measurement setups

• supported movement systems: x-stage, cross-stage, conveyor belt
• supported measurement modes: diffuse and specular reflection, transmission, emission
• macroscopic and microscopic measurements
• time-resolved measurements (staring imager setup)
• continuous measurements
   

Special features

• use of chemometric models, such as SVM, PCA, LDA, QDA, cluster analysis
• integration of third-party modules: CAMO^® classification engine, Intel^® MKL, Extreme Optimization^TM
• on-line data processing

For highest acquisition rates and fast in-line measurements the data analysis can be accelerated and combined with individual multivariate, mathematicstatistical algorithms. Multivariate data analysis can also obtain and control the process parameters. Therefore the statistical models must be trained by single parameters measurements.

Hyperspectral imaging setups for thin film inspection can be realized with the imanto® obsidian hardware or imanto® microscopy combination.
 

imanto® thin film analysis

• spatial resolved parameters
• thin film thickness (nm up to μm)
• sheet resistance (only conductive materials)
• refractive index (n, k)
• failures, defects
• quality parameter distributions
• substrate materials
• bulk metals, metal foils
• Si-wafer, semiconducting materials
• polymer webs
• glass
• thin film materials
• inorganic: (conductive) oxides, nitrides, carbides etc.
• organic: dyes, oils, fat etc.
• polymers and composites
• ultra-thin metal coatings

imanto^® surface imaging

• contamination screening
• greasy contaminations
• impurities, foreign matter
• emission measurements
• plated metals
• surface quality
• cracks, holes, gaps
• roughness
   

Laser scribing

For organic electronics the defined laser ablation is important for structuring OPV components and others. HSI offers significant potential to analyze the homogeneity and penetration depth of the scribes and the integrity of the layer below.
 

Adhesive strength

Full surface imaging is mandatory for control of component parts for bonding. IWS scientists developed a method for the prediction of the adhesive strength by HSI inspection of the surfaces to be bonded. Significant advantages are non-destructive testing, fast measurement and prior knowledge in respect to the well-known wedge test.

WVTR inspection

The use of all information of the acquired spectra and their distribution offers the possibility to estimate the water vaper transmission rate (WVTR) for barrier webs. The measurement time decreases by several orders of magnitude.

imanto^® sorting, recognition and classification:

• target parameter:
• material type
• aging, imperfections (i. e. food)
• purity and foreign matter
• all kind of powders, regrinds, pellets and granulates
• polymers:
• household: PE, PP etc.
• technical: PAx, PC, ABS etc.
• food:
• crop: barley, wheat, rye etc.
• fruit and vegetables: apples, nuts, peas etc.
• meat
• pharmaceutical and chemical products
• pills, powders and granulates
• minerals

A further sorting related task is the recognition and classification of materials – for example to inspect dedicated substance content. These tasks are not mandatorily coupled to a sorting process. To achieve a defined result, the spectral data will be usually processed by mathematical-statistical algorithms. Fraunhofer IWS will provide any assistance for a tailored solution for your task. In combination with the imanto® pro software an easy-to-use user interface and software module for all steps of recognition and classification is available.
 

Batch process control

In batch processes, HSI is able to determine the process state and ending point by using spectral and spatial data evaluation in a combined algorithm. Furthermore the results offer the possibility to influence the batch process for optimal results.
 

Powder purity

The quality and purity control of powder mixtures is an important task in many chemical processes. Beside crystalline and amorphous powders also metal powders for additive manufacturing processes can be assessed.
 

Wood impregnation

In the past decades wood was often impregnated with toxic substances such as LINDAN, PCP or DDT. To avoid skin-contact a HSI-based screening of roof frames prior to restauration provides information about possible toxic substances and their spatial distribution.
 

Genuineness of documents

Hyperspectral measurements are, due to their spectral imaging, perfectly suited for verification of the authenticity of documents. Multiple hidden features in the documents can be perfectly visualized. In combination with pattern recognition, multiple features can be analyzed. VIS and NIR spectral ranges are applicable in dependence of the document type. Examples are banknotes and counterfeit recognition as well as restorations of ancient documents and their clear assignment to an author or artist.